Single event effects on the RD53B pixel chip digital logic and on-chip CDR

Abstract The RD53B chip for HL-LHC upgrades of ATLAS and CMS pixel detectors needs to provide reliable operation in a radiation hostile environment with inevitable Single Event Effects (SEE). To answer the challenge, substantial efforts are made protect evaluate critical parts digital logic characterize on-chip Clock Data Recovery (CDR) circuit. SEE sensitivity is evaluated by testing both heavy-ions protons. CDR characterized measuring SEE-induced phase shifts its output clocks their implication on high-speed link stability.